An Systematic Modeling and Simulation Study on WIP Optimization in Semiconductor Assembly and Test Factory

Abstract:

The simulation, modeling and analysis of manufacturing systems for performance improvement have become increasingly important during the last few decades. This paper presents a practical solution to a manageable and well distributed work in process (WIP) control system with simulation experiment demonstrated by constructing the virtual production lines, addressing issues such as wafer kitting strategy, critical work in process level setting. The simulation WIP instances are coordinated and synchronized with production line influence factors and activities imported. Through the testing and actual practice, this simulation tool helps semiconductor assembly and test factory production managers effectively manage work-in-process (WIP) levels to compensate the impact of unexpected production variations and achieve better factory performance.

• Periodical: Advanced Materials Research (Volumes 201-203)
• Pages: 1086-1092
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.201-203.1086
• Online since: February 2011
• Authors: Yan Ting Ni, Jing Min Li, Wei He, Jin Yao
• Keywords: Cycle Time, Semiconductor Assembly and Test, Simulation, Throughput, Work in Process

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