The Identification of TP Chromatic Aberration by Using Nearly Equivalent NN Model

Abstract:

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This paper presents the chromatic aberration identification of touch panel (TP) decoration film by using nearly equivalent neural network (NN) model. This model is expected to adequately catch the complex relationship between the chromatic aberration and its possible influencing factors during the evaporation process of TP decoration film. Then, an intelligent estimator for the chromatic aberration of TP film could be developed automatically. Based on this estimator, the technician could set the control parameters of evaporation process in advance and make the quality of chromatic aberration of TP could meet the customer’s required.

Info:

Periodical:

Advanced Materials Research (Volumes 211-212)

Edited by:

Ran Chen

Pages:

275-279

DOI:

10.4028/www.scientific.net/AMR.211-212.275

Citation:

C. C. Huang et al., "The Identification of TP Chromatic Aberration by Using Nearly Equivalent NN Model", Advanced Materials Research, Vols. 211-212, pp. 275-279, 2011

Online since:

February 2011

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Price:

$35.00

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