The Identification of TP Chromatic Aberration by Using Nearly Equivalent NN Model

Chih Chien Huang; Du Jou Huang; Yu Ju Chen; Shu Ming T. Wang; Rey Chue Hwang

doi:10.4028/www.scientific.net/AMR.211-212.275

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Research of a Ring-Type Linear Ultrasonic Motor
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An ADRC Method for Vibrating MEMS Gyrosocope Drive
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Aero-Thermal Response Analysis for Sharp ZrB₂-SiC Leading Edge of Waverider
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The Identification of TP Chromatic Aberration by Using Nearly Equivalent NN Model
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Optimal Design of Degradation Experiment Based on Monte Carlo Simulation
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Study on Trispectrum Characteristics of MR Damper in Vibration Processes
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An Efficient Contact Analysis for Roller Chain
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An Efficient Search Scheme in Unstructured Peer-to-Peer Networks
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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 211-212The Identification of TP Chromatic Aberration by...

The Identification of TP Chromatic Aberration by Using Nearly Equivalent NN Model

Abstract:

This paper presents the chromatic aberration identification of touch panel (TP) decoration film by using nearly equivalent neural network (NN) model. This model is expected to adequately catch the complex relationship between the chromatic aberration and its possible influencing factors during the evaporation process of TP decoration film. Then, an intelligent estimator for the chromatic aberration of TP film could be developed automatically. Based on this estimator, the technician could set the control parameters of evaporation process in advance and make the quality of chromatic aberration of TP could meet the customer’s required.