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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 233-235The Ferroeletricity of Pb(Zr,Ti)O3 Films Grown on...

The Ferroeletricity of Pb(Zr,Ti)O₃ Films Grown on Compressive Substrates

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Abstract:

The modified Landau-Devonshire thermodynamic theory has been used to investigate the ferroelectricity of Pb(Zr_0.7, Ti_0.3)O₃ film grown on MgO substrate. A set of gradient thermal stresses is imposed on the films. The stress-temperature diagram, the spontaneous polarization and the dielectric susceptibility at 25°C on the stress were computed. Structure transitions of first order can be driven by the stress. The mean of out-plane spontaneous polarization and dielectric susceptibility on the temperature were also predicted.

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Periodical:

Advanced Materials Research (Volumes 233-235)

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2507-2511

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.233-235.2507

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Online since:

May 2011

Authors:

Li Qiu Su, Li Ben Li

Keywords:

Ferroelectric, Permittivity, Stress, Thin Film

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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[1] J. F. Scott and C. A. Araujo： Science Vol.246(1989), p.1400.

[2] O. Auciello, J. F. Scott, and R. Ramesh:Phys. Today Vol.51(1998), p.22.

[3] B. Jaffe, W.R. Cook, Jr., and H. Jaffe: Piezoelectric Ceramics (Academic, New York, 1971).

[4] P. K. Larsen, G. J. M. Dormans, D. J. Taylor, and P. J. van Veldhoven: J. Appl. Phys. Vol. 76(1994), p.2405.

[5] A. K. Tagantsev, Cz. Pawlaczyk, K. Brooks, and N. Setter: Integr. Ferroelectr. Vol.4(1994), p.1.

[6] M. B. Kelman and Paul C. McIntyre, Bryan C. Hendrix, Steven M. Bilodeau, and Jeffrey F. Roeder, Sean Brennan: J.Mater.Res. Vol. 18(2003), p.173.

[7] S. Hoon Oh and Hyun M. Jang: Phys. Rev. B Vol.63(2001), p.132101.

[8] S. B. Desu: Phys.Status Solidi A Vol.141(1994), p.119.

[9] A. L. Roitburd: Phys.Status Solidi A Vol. 141(1994), p.119.

[10] H. J. Kim, S. H. Oh, M. J. Jang: Appl. Phys. Lett. Vol.75(1999), p.3195.

[11] Wang Minzhong, Wang Wei, Wu Jike: Elastic Mechanics Tutorial (Publishing Company of Beijing University. Beijing 2002).

[12] S. Hoon Oh and Hyun M. Jang: Appl. Phys. Lett. Vol.72 (1998), p.1457.

[13] N. A. Pertsev and A. G. Zembilgotov, S. Hoffmann and R. Waser, A. K. Tagantsev: J. Appl. Phys. Vol.85(1999) , p.1698.

[14] A. Amin, R.E. Newnham, and L.E. Cross: Phys.Rev.B Vol. 34(1986), p.1595.

[15] M.J. Haun, Z.Q. Zhuang, E. Furman, S.J. Jing: Ferroelectrics Vol.99(1989), p.13.

[16] I. Kanno, Y. Yokoyama, and H. Kotera, K. Wasa: Phys. Rev. B Vol.69(2004), p.64103.