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A Theoretical Analysis of the Fracture Behavior of a Multi-Layered Thin Film Structure under Residual Tensile Stress

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Abstract:

In this work, the fracture behavior of a multi-layered thin film structure under residual tensile stress is investigated theoretically. Using composite material theory and a modified shear-lag model, the analytical solutions for the distribution laws of the tensile stress developed in the first-layer thin film and the shear stress developed along the interface can be obtained. In addition, the crack density of the first-layer thin film can be derived from the residual stress and the mechanical and geometric parameters of the cracked system. This result also yields a measurement of the residual stress from the crack density and the mechanical and geometric parameters of the system. Finally, a numerical example is presented to show how the crack density varies versus the residual stress.

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Advanced Materials, CEAM 2011 View Preview

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Periodical:

Advanced Materials Research (Volumes 239-242)

Pages:

2179-2182

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.239-242.2179

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Online since:

May 2011

Authors:

Ban Quan Yang, Fa Xin Li

Keywords:

Crack Density, Fracture Behaviour, Multi-Layered Thin Film Structure, Residual Stress

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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