[1]
M.S. Blois: Preparation of thin magnetic films and their properties, J. Appl. Physics 26 (8) (1995) pp.975-80.
Google Scholar
[2]
J.L. Raffel: Operating characteristics of a thin film memory, J. Appl. Phys. 30 (4) (1959) p. 60S-61S.
Google Scholar
[3]
R.C. Kell: Magnetic films for storing information in computers, GEC J. Sci. Technol. 30 (1) (1963) pp.18-21.
Google Scholar
[4]
W. Thompson: Effects of magnetization on the electric conductivity of nickel and of iron, 5Proc. Royal Soc. London Vol. 8 (1875).
Google Scholar
[5]
U. Dibbern: Sensor based on the magnetoresistive effect, Sensors and Actuators Vol. 4 (1983), pp.221-7.
Google Scholar
[6]
V.B. Chapman: A study of the relationship between the deposition parameters, film structure and magnetic properties of NiFe thin films, Ph. D thesis for the Council for National Academic Award (1979).
Google Scholar
[7]
R.S. Wilder and R,G. Johnson: High Vacuum systems for sputtering applications, Solid State Technol, (Nov. 1985) pp.95-8.
Google Scholar
[8]
J.S. Lemke: Effect of substrate cleanness on permalloy thin films J. Appl. Phys. Vol. 33 (3) (1962) pp.1097-99.
Google Scholar
[9]
A.G. Lesnik: Influence of irregularities of the substrate surface on the coervice force of permalloy films Izy. Akad. Nauk. USSR Ser. Fiz. Vol. 29 (1965) pp.594-8.
Google Scholar
[10]
A. Green and B.W.J. Thomas: A simple hysteresis loop plotter using the transverse Kerr effect. J. Sci. Instrum. (GB) Vol. 43 (6) (1966) pp.399-400.
DOI: 10.1088/0950-7671/43/6/418
Google Scholar
[11]
A.J. Collins: The effect of annealing on the magnetic properties of NiFe films Ph. D thesis in the University of Wales (1971).
Google Scholar
[12]
A.J. Collins, M. Husni and R.M. Jones: A versatile high magnification Kerr magneto-optic microscope. J. Phys.E. Sci. Instrum. Vol. 11 (1978) pp.1-5.
DOI: 10.1088/0022-3735/11/6/014
Google Scholar
[13]
G. Bayreurther and H. Hoffmann: Influence of ripple and skew on the fall-back angle in thin uniaxial permalloy films Czech. J. Phs. Vol. B21 (1971) pp.541-5.
DOI: 10.1007/bf01691550
Google Scholar
[14]
T.S. Crowther: Angular and magnitude dispersion of the Anisotropy in magnetic films J. Appl. Physics Vol. 34 (3) (1963) pp.580-6.
Google Scholar
[15]
V.V. Kobelev: A new method of measuring anisotropy of ferromagnetic films, Phys. Of Met. & Metallog. Vol. 13 (1962) pp.146-9.
Google Scholar
[16]
K. Kempters and H. Hoffmann: An improved method for determination of the anisotropy field of ferromagnetic thin films Z. Angew. Phys. Vol. 28 (50) (1970) pp.251-7.
Google Scholar
[17]
L.L. Sanders: Aspect of domain tip devices Ph. D thesis in the University of Wales (1977).
Google Scholar
[18]
P. Akhtar: Radio-Frequency sputtered, Radio-frequency biased Nickel Iron films for magnetoresistive applications Ph. D thesis in the University of Wales (1993).
Google Scholar
[19]
A.J. Collins, C.J. Prior and C.J. Hicks: The magnetic Properties of RF-sputtered Permalloy and Mumetal films Thin Solid Films Vol. 86 (1981) pp.165-74.
DOI: 10.1016/0040-6090(81)90285-6
Google Scholar
[20]
H. Hoffmann: Static wall coercive force in ferromagnetic thin films IEEE Trans. Magn. Vol. MAG-9 (1) (1973) pp.17-21.
DOI: 10.1109/tmag.1973.1067560
Google Scholar
[21]
W.N. Hammer, and Y.K. Ahn: Effects of oxygen on properties of r. f. suputtered NiFe films J. Vac. Sci. Technol. 17 (4) (1980) pp.804-7.
Google Scholar
[22]
A.J. Griest, and B.L. Flur: Properties of manganese-permalloy films, J. Appl. Physics 38 (3) (1967) pp.1431-33.
DOI: 10.1063/1.1709652
Google Scholar
[23]
R. Minakata: Magnetic properties of Ni-Fe films prepared by a D.C. triode sputtering method, IEEE Trans. Magn. MAG-24 (3) (1988) pp.2020-3.
DOI: 10.1109/20.3394
Google Scholar
[24]
H. Hoffmann: Experimental verification of the 'Blocking Curve', in the permalloy films J. Appl. Phys. Vol. 42 (1) (1971) pp.357-61.
Google Scholar
[25]
W.N. Mayer: Sputtered thin magnetic films, IEEE Trans. Magn. MAG-2 (3) (1966) pp.166-83.
Google Scholar
[26]
V.B. Chapman, A.A. Marwaha and A.J. Collins: The effect of substrate temperature on the magnetic and structural properties of Ni-Fe Thin Solid Films, J. Appl. Phys. Vol. 76 (1981) pp.77-82.
DOI: 10.1016/0040-6090(81)90068-7
Google Scholar