Design of a Random Test Platform for DSP Serials Used in Embedded Systems

Chi Pin Wei; Zhao Lin Li; Hao Liu; Zhi Xiang Chen

doi:10.4028/www.scientific.net/AMR.267.98

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 267Design of a Random Test Platform for DSP Serials...

Design of a Random Test Platform for DSP Serials Used in Embedded Systems

Abstract:

Embedded systems with digital signal processor (DSP) become more and more popular for the increasing requirement of supercomputing these days. Efficient development of DSP serials used in embedded systems shortens the embedded system R&D cycle. Functional verification is one of the most complex and expensive tasks during DSP serials design process. A random test platform which is urged for DSP serials verification is proposed in this paper. The platform can automatically generate the random test program. The platform also realized the recording and checking of simulation results, which make the verification more effective. In order to improve the efficiency of DSP verification, a testing experience library has been generated through the testing procedure. This platform can be transplanted for different DSP models easily by updating few modules. According to the verification results, this platform has satisfactory coverage of DSP models.

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Periodical:

Advanced Materials Research (Volume 267)

Pages:

98-103

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.267.98

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Online since:

June 2011

Authors:

Chi Pin Wei, Zhao Lin Li, Hao Liu, Zhi Xiang Chen

Keywords:

Digital Signal Processor (DSP), Embedded System, Portability, Random Test Platform, Test Experience Library

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