Characterization of Ag Doped P-Type ZnO Thin Films Prepared by Electrostatic-Enhanced Ultrasonic Spray Pyrolysis

Jia Hua Min; Xiao Yan Liang; Bin Wang; Yue Zhao; Yun Guo; Lin Jun Wang

doi:10.4028/www.scientific.net/AMR.299-300.436

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 299-300Characterization of Ag Doped P-Type ZnO Thin Films...

Characterization of Ag Doped P-Type ZnO Thin Films Prepared by Electrostatic-Enhanced Ultrasonic Spray Pyrolysis

Abstract:

In this paper, the structure, electrical and optical properties and stabilities of Ag doped p-type ZnO thin films, prepared by electrostatic-enhanced ultrasonic spray pyrolysis were investigated. XRD and Hall data analyses indicated that the resistivity of 4at. % Ag doped p-type ZnO was low, without Ag₂O phase separation. The optical transmission spectra illustrated that optical band gaps decreases with the gradual increase of Ag dopant. Moreover, ZnO: Ag films placed for 10 days still showed p-type, but the optical transmittance decreased, suggesting that Ag_Zn in the ZnO: Ag thin films captured electrons to generate Ag_i, which reunited to be Ag nano-particles and decreased the optical transmittance of ZnO: Ag.

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Advanced Materials Research (Volumes 299-300)

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436-439

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.299-300.436

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Online since:

July 2011

Authors:

Jia Hua Min, Xiao Yan Liang, Bin Wang, Yue Zhao, Yun Guo, Lin Jun Wang

Keywords:

Ag-Doped, Electrostatic-Enhanced Ultrasonic Spray Pyrolysis, P-Type ZnO Thin Film, Stability Property

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