Influence of Doping Methods on the Gas-Sensing Properties of CuO-SnO2 Sensors

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Abstract:

Nano crystalline SnO2 was prepared by sol-gel with PEG surfactant. CuO was doped in the SnO2 by mechanical mixture and reaction congelation from CuCl. The samples were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM) and nitrogen adsorption isotherms (BET). The results indicated that the average crystal size of SnO2 at sintering temperature of 550 °C was 10 nm, the conglomeration size of SnO2 was about 100 nm. The specific surface area of pure SnO2, mechanical doping SnO2 and reaction doping SnO2 were 110, 84, 72 m2/g, respectively. The thick film gas sensors made from these samples were examined. SnO2 doped by different methods had different electrical and gas-sensing properties. The sensors based on CuO doped SnO2 films exhibited less sensitive to ethanol gas but extremely higher sensitivity to H2S gas than that of pure SnO2.

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Advanced Materials Research (Volumes 306-307)

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1289-1295

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August 2011

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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[1] M. J. Madou and S. R. Morrison, Chemical sensing with solid-state devices, Academic Press, San Diego CA (1989).

Google Scholar

[2] F. Edelman, H. Hahn, S. Seifried etal. Mater. Sci. Eng. B69–70, 386–391 (2000).

Google Scholar

[3] L.A. Patil, D.R. Patil, Sens. Actuators B120, 316–323(2006).

Google Scholar

[4] K. Ihokura, J. Watson, The Stannic Oxide Gas Sensor Principles and Applications, 1st ed., CRC Press, 1994.

Google Scholar

[5] V. Guidi, M. A. Butturi, M. C. Carotta, B. Cavicchi, M. Ferroni, C. Malagù, G. Martinelli, D. Vincenzi, M. Sacerdoti, M. Zen, Sens. Actuators B84, 72–77 (2002).

DOI: 10.1016/s0925-4005(01)01077-2

Google Scholar

[6] T. Maekawa, J. Tamaki, N. Miura and N. Yamazoe, Chem. Lett. 575-578 (1991).

Google Scholar

[7] X. Kong, Y. Li, Sens. Actuators B 105, 449–453(2005).

Google Scholar

[8] X. Xue, L. Xing, Y. Chen, S. Shi, Y. Wang, T. Wang, J. Phys. Chem. C 112, 12157- 12160(2008).

Google Scholar

[9] L. He, Y. Jia, F. Meng, M. Li, J. Liu, J. Mater. Sci. 44, 4326-4333 (2009)

Google Scholar

[10] X. Gao, J. Bao, G. Pan, H. Zhu, P. Huang, F. Wu and D. Song, J. Phys. Chem. B 108, 5547-5551 (2004).

Google Scholar

[11] Bruker AXS, Topas V2.0: general profile and structure analysis software for powder diffraction data, user manual. Bruker AXS, Karlstruhe (2000).

Google Scholar

[12] Balzar D, Defect and microstructure analysis from diffraction. In: Snyder RL, Bunge HJ, Fiala J (eds) International union of crystallography monographs on crystallography no. 10. Oxford University Press, New York, p.94 (1999).

DOI: 10.1017/s0885715600021503

Google Scholar

[13] G. Fang, Z. Liu, Z. Zhang, Y. Hu, I. Ashur, K. Yao, Physica status solidi. A: Applied research. 156,15-22 (1996).

Google Scholar

[14] J.F. McAleer, P.T. Moseley, J.O.W. Norris, D.E. Williams, J. Chem. Soc., Faraday Trans. I83, 1323–1346 (1987).

Google Scholar

[15] Q.Y. Pan, J.Q. Xu, X.W. Dong, J.P. Zhang, Sens. Actuators B 66, 237–239 (2000).

Google Scholar

[16] M.S. Wagh, L.A. Patil, D.P. Amalnerkar, Mater. Chem. Phys. 84, 228–233 (2004)

Google Scholar