Investigation of Laser Current Influence on Two-Dimensional Bar Code Contrast

Abstract:

Laser current is a key parameter in laser direct-part marking symbols on a substrate. Different laser current can create enormous impact on bar code contrast, but the influencing regularities are unclear. In this paper, a new significance test method based on the multivariate nonlinear model was proposed to investigate the influencing regularities. First, the multi-element nonlinear stepwise regression model between the laser current, the laser line spacing and symbol contrast was established, and then the model significance test was employed to evaluate the influence between the two factors and symbol contrast. Finally, the influencing regularities were found by comparing the influence between the laser current and the laser line spacing. These regularities are that along with the laser current value increasing the influence of laser current on symbol contrast decreases and that the effect is much smaller and can even be neglected when the laser current reaches or exceeds a certain value. This certain value is 15 A in the Nd:YAG laser Direct-part marking symbols on the aluminum alloy experiments.

• Periodical: Advanced Materials Research (Volumes 314-316)
• Pages: 197-204
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.314-316.197
• Online since: August 2011
• Authors: Hua Dong Qiu, Chang Hou Lu, Wei Chen, Jian Mei Li
• Keywords: Laser Current, Laser Marking, Multi-Element Nonlinear Model, Significance Test, Symbol Contrast

References

[1] R. C. Palmer: The Bar Code Book (Helmers Publishing Press, Peterborough NH 2001)

[2] NASA: Application of Data of Data Matrix Identification Symbols to Aerospace Parts Using Direct Part Marking Methods/Techniques (NASA Press, Washington DC 2002)

[3] M. F. Chen, W. T. Hsiao, W. L. Huang, et al.: Materials Processing Technology, Vol. 209 (a)(2009), p.737

[4] M. F. Chen, W. T. Hsiao, W. L. Huang, et al.: Materials Processing Technology, Vol. 209 (b)(2009), p.470

[5] B. E. Parker:, US Patent WO2,004,064,530 (2004)

[6] J. David Porter: Manufacturing Science and Engineering, Vol. 129 (2007), p.583

[7] J. David Porter: Journal of Intelligent Manufacturing, Vol. 17 (2006), p.133

[8] J. Qi, K. L. Wang, Y. M. Zhu: Materials Processing Technology, Vol. 139 (2003), p.273

[9] C. Leone, S. Genna: Materials Processing Technology, Vol. 210 (2010), p.1297

[10] S. Valette, P. Steyer, L. Richard.et al.: Applied Surface Science, Vol. 252 (2006), p.4696

[11] T. W. Ng, S. C. Yeo: Optics and Laser in Engineering, Vol. 35 (2001), p.177

[12] E. Cicalà, A. Soveja, P. Sallamand, et al.: Journal of Materials Processing Technology, Vol. 196 (2008), p.393

[13] T. Shanableh, K. Assaleh: Neurocomputing, Vol. 73 (2010), p.1752

[14] J. P. Jia: Statistics (Tsinghua University Press, Beijing 2004)，In Chinese

[15] X. Z. Wang: Nonlinear Model Parameter Estimation Theory and Application (Wuhan University Press, Wuhan 2002)

[16] A. Bortfeldt, H. Gehring: European Journal of Operational Research, Vol. 13 (2001), p.143

[17] K. Deb,A. Pratap,S. Agarwal,et al.: Evolutionary Computation , Vol. 6 (2002), p.182

[18] D. Feng : Solid State Physics Dictionary (Higher Education Press, Beijing 1995), In Chinese