Fabrication and Electrical Properties of P(VDF-TrFE)/Bi3.5Nd0.5Ti3O12 Bi-Layer Composite Ferroelectric Thin Films
The microstructure and electrical properties of P(VDF-TrFE)/Bi3.5Nd0.5Ti3O12 bi-layer composite ferroelectric thin films deposited on Pt/Ti/SiO2/Si using two successive spin coatings were investigated. It shows the pores in Bi3.5Nd0.5Ti3O12 (BNT) films were effectively suppressed by the presence of P(VDF-TrFE) copolymer films by SEM. The ferroelectric, leakage and dielectric properties of the thin films with different thickness ratio of P(VDF-TrFE) and BNT thin films were measured. With increasing the thickness of P(VDF-TrFE), the remnant polarization, coercive electric field, leakage current density and dielectric constant of thin films were all decreased (except pure P(VDF-TrFE) thin film). Results indicate that the key electrical properties were improved effectively by a little loss of the remnant polarization, which infers potential application in the filed of ferroelectric memory.
Jun Hu and Qi Luo
S. B. Yang et al., "Fabrication and Electrical Properties of P(VDF-TrFE)/Bi3.5Nd0.5Ti3O12 Bi-Layer Composite Ferroelectric Thin Films", Advanced Materials Research, Vol. 320, pp. 170-175, 2011