Carbon Black Conductive Composite Based Resistance-Temperature Measurement System Using AT89S51

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Abstract:

AT89S51 microcontroller based carbon black conductive composite materials resistance-temperature measurement system is designed, which achieves the measurements of resistance and temperature with the help of thermocouple amplifier chip AD595. Describe the hardware and software design, especial the acquisition of temperature and resistance and the display process. The experimental results show that the system can easily and accurately measure the resistance and temperature and the metrical data validate the PTC properties of carbon black conductive composite.

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230-234

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August 2011

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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[1] Choimn, Jeonbh, Chung I J. The Effect of Coupling Agent on Electical and Mechanical Properties of Carbon Fiber/ Phenolic Resin Composites [J]. Polym, 2000, 41(9): 3243-3252.

DOI: 10.1016/s0032-3861(99)00532-7

Google Scholar

[2] HUANG Xing. Study on Conductivity of Carbon-black-filled Plastics and its Application [J]. Plastics Science and Technology, 2001, 37(3): 4–7.

Google Scholar

[3] Analog Devices. Inc, Monolithic Thermocouple Amplifiers with Cold Junction Compensation AD595. (1999).

Google Scholar

[4] ZHOU Tian wei, CHEN Xiao hui. A fuzzy control system design of constant temperature based on semiconductor refreigeration [J]. Microcompupter Information, 2007, 20(28): 156–159.

Google Scholar

[5] WAN Li feng, XU Xiao jie, CHEN Xiao wei. Study and Development of a Kind of Minitype Thermoelectric Constant Temperautre System [J]. Computer Measurement & Control, 2006, 22(8): 89–94.

Google Scholar

[6] ZHANG Zhi li, HOU Chuan xun, JIANG Yi. Study on Numeric Computatioin Method of Semiconductor Refrigeration [J]. Control and Instruments in Chemical Industry, 2011, 26(1): 106–110.

Google Scholar

[7] LI Mao de, LU Xi hong. Influence of Intensity of Heat Emission on Performance of Semiconductor Refrigeration [J]. Journal of Tongji University, 2002, 6(7): 137–140.

Google Scholar

[8] HE Li ming. Application Design System Configuration and Interface on MCS-51 [M]. Bei Jing: Bei Hang University Press, (2004).

Google Scholar

[9] SHEN Gong tian, ZHANG Wan ling. Survey of Nondestructive Testing Techniques for Special Equipment [J]. Nondestructive Testing, 2006, 13(1): 156–160.

Google Scholar