Computational Model for Machine Vision Inspection Based on Vision Attention

Abstract:

Article Preview

Human vision system exploits this fact by visual selective attention mechanisms towards important and informative regions. A computational model of combination both bottom-up and top-down simulating human vision system for machine vision inspection is proposed. In this model, top-down knowledge-based information is highlighted to integrate into bottom-up stimulus-based process of vision attention. The model is tested on inspecting contaminants in cotton images. Experiment result shows that the proposed model is feasible and effective in visual inspection. And it is available and quasi-equivalent to human vision attention.

Info:

Periodical:

Advanced Materials Research (Volumes 383-390)

Edited by:

Wu Fan

Pages:

2398-2403

DOI:

10.4028/www.scientific.net/AMR.383-390.2398

Citation:

J. F. Shi et al., "Computational Model for Machine Vision Inspection Based on Vision Attention", Advanced Materials Research, Vols. 383-390, pp. 2398-2403, 2012

Online since:

November 2011

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.