Computational Model for Machine Vision Inspection Based on Vision Attention

Jin Fang Shi; Zhen Wei Su; Guo Hui Li

doi:10.4028/www.scientific.net/AMR.383-390.2398

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 383-390Computational Model for Machine Vision Inspection...

Computational Model for Machine Vision Inspection Based on Vision Attention

Abstract:

Human vision system exploits this fact by visual selective attention mechanisms towards important and informative regions. A computational model of combination both bottom-up and top-down simulating human vision system for machine vision inspection is proposed. In this model, top-down knowledge-based information is highlighted to integrate into bottom-up stimulus-based process of vision attention. The model is tested on inspecting contaminants in cotton images. Experiment result shows that the proposed model is feasible and effective in visual inspection. And it is available and quasi-equivalent to human vision attention.

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Manufacturing Science and Technology, ICMST2011

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Periodical:

Advanced Materials Research (Volumes 383-390)

Pages:

2398-2403

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.383-390.2398

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Online since:

November 2011

Authors:

Jin Fang Shi, Zhen Wei Su, Guo Hui Li

Keywords:

Bottom-up, Top-Down, Visual Computational Model, Visual Inspection

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