[1]
Ü. Özgür, Y.I. Alivov, C. Liu, A. Teke, M.A. Reshchikov, S. Doğan, V. Avrutin, S.J. Cho and H. Morkoç: J. Appl. Phys. Vol. 98 (2005), p.041301.
DOI: 10.1063/1.1992666
Google Scholar
[2]
F. Pan, C. Song, X.J. Liu, Y.C. Yang and F. Zeng: Mater. Sci. Eng. R. Vol. 62 (2008), p.1.
Google Scholar
[3]
L. Schmidt-Mende and J.L. MacManus-Driscoll: Mater. Today Vol. 10 (2007), p.40.
Google Scholar
[4]
S.J. Pearton, D.P. Norton, Y.W. Heo, L.C. Tien, M.P. Ivill, Y. Li, B.S. Kang, F. Ren, J. Kelly and A.F. Hebard: J. Electron. Mater. Vol. 35 (2006), p.862.
DOI: 10.1007/bf02692541
Google Scholar
[5]
K. Sato and H. Katayama-Yoshida: Semicond. Sci. Technol. Vol. 17 (2002), p.367.
Google Scholar
[6]
H. Saeki, H. Matsui, T. Kawai and H. Tabata: J. Phys. -Condes. Matter Vol. 16 (2004), p. S5533.
Google Scholar
[7]
R. Janisch, P. Gopal and N.A. Spaldin: J. Phys. -Condes. Matter Vol. 17 (2005), p. R657.
Google Scholar
[8]
B.S. Kang, W.C. Kim, Y.Y. Shong and H.J. Kang: J. Cryst. Growth Vol. 287 (2006), p.74.
Google Scholar
[9]
T. Fukumura, Z.W. Jin, M. Kawasaki, T. Shono, T. Hasegawa, S. Koshihara and H. Koinuma: Appl. Phys. Lett. Vol. 78 (2001), p.958.
DOI: 10.1063/1.1348323
Google Scholar
[10]
Q.Y. Xu, H. Schmidt, H. Hochmuth, M. Lorenz, A. Setzer, P. Esquinazi, C. Meinecke and M. Grundmann: J. Phys. D: Appl. Phys. Vol. 41 (2008), p.105012.
DOI: 10.1088/0022-3727/41/10/105012
Google Scholar
[11]
L. Zhao, P. -F. Lu, Z. -Y. Yu, Y. -M. Liu, D. -L. Wang and H. Ye: Chin. Phys. B Vol. 19 (2010), p.056104.
Google Scholar
[12]
L. Li, W. Wang, H. Liu, X. Liu, Q. Song and S. Ren: J. Phys. Chem. C Vol. 113 (2009), p.8460.
Google Scholar
[13]
T. Naydenova, P. Atanasov, M. Koleva, N. Nedialkov, J. Perriere, D. Defourneau, H. Fukuoka, M. Obara, C. Baumgart, S. Zhou and H. Schmidt: Thin Solid Films Vol. 518 (2010), p.5505.
DOI: 10.1016/j.tsf.2010.04.034
Google Scholar
[14]
M. Venkatesan, C.B. Fitzgerald, J.G. Lunney and J.M.D. Coey: Phys. Rev. Lett. Vol. 93 (2004), p.177206.
Google Scholar
[15]
A. Janotti and C.G. Van de Walle: Phys. Rev. B Vol. 76 (2007), p.165202.
Google Scholar
[16]
Q.Y. Xu, H. Schmidt, S.Q. Zhou, K. Potzger, M. Helm, H. Hochmuth, M. Lorenz, A. Setzer, P. Esquinazi, C. Meinecke and M. Grundmann: Appl. Phys. Lett. Vol. 92 (2008), p.082508.
DOI: 10.1063/1.2885730
Google Scholar
[17]
H.J. Monkhorst and J.D. Pack: Phys. Rev. B Vol. 13 (1976), p.5188.
Google Scholar
[18]
J.P. Perdew, K. Burke and M. Ernzerhof: Phys. Rev. Lett. Vol. 77 (1996), p.3865.
Google Scholar
[19]
S.X. Cui, W.X. Feng, H.Q. Hu, Z.B. Feng and Y.X. Wang: J. Alloys Compd. Vol. 476 (2009), p.306.
Google Scholar
[20]
H. Saeki, H. Tabata and T. Kawai: Solid State Commun. Vol. 120 (2001), p.439.
Google Scholar
[21]
N. Tahir, S.T. Hussain, M. Usman, S.K. Hasanain and A. Mumtaz: Appl. Surf. Sci. Vol. 255 (2009), p.8506.
Google Scholar
[22]
S. Desgreniers: Phys. Rev. B Vol. 58 (1998), p.14102.
Google Scholar
[23]
Q. Wang, Q. Sun, P. Jena, Z. Hu, R. Note and Y. Kawazoe: Appl. Phys. Lett. Vol. 91 (2007), p.063116.
Google Scholar