Magnetic and Relaxation Properties of (CO45Fe45Zr10)x(Al2O3)1-x Thin Films

Abstract:

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The work is devoted to the research of the magnetic resonance properties of composite (metal-dielectric) films and revealing their relationship with the nanostructure characteristics and degree of crystallinity. The FMR line width and resonance position for two series of composite films have been investigated. First films series has a small metal crystal phase content. The second one contains metal oxide and amorphous. The results of work shows that oxidation of a metal phase displaces percolation bound to area of the big metal concentration. Strong changes of FMR properties of the films are observed below the percolation bound. The significant changes of FМR properties are connected to nanostructural transformations in the ferromagnetic granules topology and presence of metal phase oxide.

Info:

Periodical:

Advanced Materials Research (Volumes 47-50)

Edited by:

Alan K.T. Lau, J. Lu, Vijay K. Varadan, F.K. Chang, J.P. Tu and P.M. Lam

Pages:

706-709

DOI:

10.4028/www.scientific.net/AMR.47-50.706

Citation:

L.N. Kotov et al., "Magnetic and Relaxation Properties of (CO45Fe45Zr10)x(Al2O3)1-x Thin Films", Advanced Materials Research, Vols. 47-50, pp. 706-709, 2008

Online since:

June 2008

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Price:

$35.00

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