The Technique for Fabricating Submicron Moiré Grating Using FIB Milling

Abstract:

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In this study, focused gallium ion (Ga+) beam is utilised to fabricate micro/submicron spacing gratings on specimen surface. The grating types include: parallel, cross, and hybrid (grating with double-frequency). Several hybrid gratings with double frequency were produced in combination mode or superposition mode, which have a good potential to measure deformation within different range. Techniques for producing different type of gratings are discussed in detail. As an application, a 5000 lines/mm grating was fabricated on an amorphous SIC MEMS cantilever and was successfully used to measure its virtual strain with aid of digital moiré. The experimental results verify the feasibility of fabricating high frequency grating on metal or non-metal surface using the FIB milling and the resultant grating can be used to measure micro-deformation.

Info:

Periodical:

Advanced Materials Research (Volumes 47-50)

Edited by:

Alan K.T. Lau, J. Lu, Vijay K. Varadan, F.K. Chang, J.P. Tu and P.M. Lam

Pages:

710-713

DOI:

10.4028/www.scientific.net/AMR.47-50.710

Citation:

H. M. Xie et al., "The Technique for Fabricating Submicron Moiré Grating Using FIB Milling ", Advanced Materials Research, Vols. 47-50, pp. 710-713, 2008

Online since:

June 2008

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Price:

$35.00

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