A New Hardware-in-the-Loop Test System for Electronic Control Unit of Dual-Clutch Transmission Vehicle

Ran Chen; Lin Mi; Wei Tan

doi:10.4028/www.scientific.net/AMR.490-495.13

Paper Titles

Preface and Committee

A New Coordinate Control Method for Electric Motor Regenerative Braking and ABS Coordinate
p.3

A Limited Interval Gradient Projection Algorithm for Inverse Kinematics
p.7

A New Hardware-in-the-Loop Test System for Electronic Control Unit of Dual-Clutch Transmission Vehicle
p.13

A Clonal Selection Algorithm Based Optimization of Activated Sludge Process
p.19

A Method for Path Generation of Robot Automatic Polishing Based on Bounding Box
p.24

A New Kind of Locking Device for Centrifuge Nacelle
p.29

A Temperature Control Method about Two-Dimensional Correlation of Infrared
p.33

A Multi-Channel Data Acquisition System and its Performance Analysis Method Based on FPGA
p.37

HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 490-495A New Hardware-in-the-Loop Test System for...

A New Hardware-in-the-Loop Test System for Electronic Control Unit of Dual-Clutch Transmission Vehicle

Abstract:

Hardware-in-the-loop simulation (HILS) is a scheme that incorporates some hardware components of primary concern in the numerical simulation environment. This paper discusses the implementation and benefits of using the HIL testing system for electronic control unit of dual-clutch transmission (DCT) vehicle.

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Periodical:

Advanced Materials Research (Volumes 490-495)

Pages:

13-18

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.490-495.13

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Online since:

March 2012

Authors:

Ran Chen, Lin Mi, Wei Tan

Keywords:

Dual-Clutch Transmission (DCT), Electronic Control Unit (ECU), Hardware-in-the-Loop Simulation (HILS), Patent, Test System, Vehicle

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