Use Spectrum Analysis to Test the Frequency-Domain Characteristics Parameters of ADCs

Shi Rong Yin

doi:10.4028/www.scientific.net/AMR.510.401

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 510Use Spectrum Analysis to Test the Frequency-Domain...

Use Spectrum Analysis to Test the Frequency-Domain Characteristics Parameters of ADCs

Abstract:

Many frequency-domain characteristics parameters can describe the dynamic behaviour of Analog to Digital Converters (ADCs). This paper researched how to use a sinewave stimulus and spectrum analysis to test those parameters. It analyzed the spectrum of coherent sampling and incoherent sampling of ADC response to a specified amplitude and frequency sinewave firstly. Incoherent sampling causes spectrum leakage. To reduce the errors in calculating parameters introduced by spectral leakage, this paper multiply the data record by a window function in the time domain prior to the DFT process. Simulate results demonstrate that window function can reduced the spectral leakage introduced by incoherent sampling and increase ADC parameters calculation accuracy.

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Periodical:

Advanced Materials Research (Volume 510)

Pages:

401-405

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.510.401

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Online since:

April 2012

Authors:

Shi Rong Yin

Keywords:

Spectral Leakage, Test ADCs, Window Function

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