Analysis of Copper and Copper Alloys Electric Components Short Circuited Melted Mark Metallographic Structure

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Abstract:

The current standard is lacking of characteristic criterion and references of various copper alloys material electric components short-circuited melted-mark metallographic structure, thus it is to the disadvantage of the development of fire investigation physical evidence identification. In the thesis, by conducting fire simulated experiments of primary short circuit and secondary short circuit with pure copper and brass alloys electric components, apply metallographic analysis methods and image processing technology to discuss and analyse the melted mark metallographic structure.

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Periodical:

Advanced Materials Research (Volumes 535-537)

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869-874

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June 2012

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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[1] WANG Xiqing, HAN Baoyu, etc. Manual of Electrical Fire Scene Investigation and Identification Technique in Chinese [M]. Shenyang: Liaoning University Press, (1977)

Google Scholar

[2] WEI Wei, etc. Analysis of Metallographic Structure of Copper Conductor Short Circuited Melted Bead in Electrical Accidents in Chinese [J]. F. 2007, 26(2):211-214.

Google Scholar

[3] Mo Shanjun, Peng Wenjing, etc. Quantitative Analysis of Metallographic Structure Parameters of the Melting Trace Caused by the First Short Circuit in Chinese, 2012, 8(1):63-70

Google Scholar

[4] WEI Meimei, MO Shanjun, LIANG Dong ,LI Jibo. The Experiment on Melted Mark Formed by Copper Wire in Electrical Fire and the Analytic Researcher on the Feature Parameters of Metallographic Structure. Procedia Engineering in Chinese 11 (2011) 504-513

DOI: 10.1016/j.proeng.2011.04.689

Google Scholar

[5] WU Wei, HU Shuangqi. Study of SEM Analytical Method of Electrical Fire Residue in Chinese [J]. Journal of Safety Science and Technology. 2010, 6(4):15-19.

Google Scholar

[6] YU Zhenping. Identification of Primary Short Circuited Melted Mark and Secondary Short Circuited Melted Mark with Metallographic Micro-technic in Chinese [J]Fujian Analysis and Testing.. 2007, 16(4):46-47.

DOI: 10.4028/www.scientific.net/amr.591-593.945

Google Scholar