TEM and SEM Analysis for Formation Mechanism of Tin Whiskers

Noriyuki Kuwano; Sadanori Horikami; Masanori Maeda; Harini Sosiati

doi:10.4028/www.scientific.net/AMR.545.16

Paper Titles

Single Crystal X-Ray Structural Determination: A Powerful Technique for Natural Products Research and Drug Discovery
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TEM and SEM Analysis for Formation Mechanism of Tin Whiskers
p.16

Functional Films of Polymer-Nanocomposites by Electrospinning for Advanced Electronics, Clean Energy Conversion, and Storage
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Nanostructured A₂(RE,B)O₆ (A = Ba, Sr; RE = Rare-Earth; B = Sb, Zr) Perovskite Ceramics and their Potential Applications in Microwave and Superconducting Electronics
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Optical Properties of Si Quantum Dot Potential under Pressure Effect
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Pulsed LASER Deposition of MgO Thin Films
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Quasicrystal Surfaces: Structure, Adsorption and Epitaxy
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Combustion Synthesis of Ni/Al Base Composites
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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 545TEM and SEM Analysis for Formation Mechanism of...

TEM and SEM Analysis for Formation Mechanism of Tin Whiskers

Abstract:

Close observation with a transmission electron microscope (TEM) and a scanning electron microscope (SEM) was performed for the growth process of tin (Sn) whiskers on lead (Pb)-free Sn-plating. Whiskers were formed on a Sn layer plated on Cu/polyimide flexible substrate. The whisker was found to be of a single crystal and have a characteristic "Y"-shaped grain boundary structure at its root. The growth process of a curling whisker was successfully observed in a continuous way in SEM. TEM observation revealed that the curling whisker had a single crystallographic orientation irrespective with its external shape. these microstructures indicate that the rearrangement of dislocations plays an important role in the growth process of whiskers.

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Periodical:

Advanced Materials Research (Volume 545)

Pages:

16-20

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.545.16

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Online since:

July 2012

Authors:

Noriyuki Kuwano, Sadanori Horikami, Masanori Maeda, Harini Sosiati

Keywords:

Electron Microscopy, Formation Mechanism, In Situ Observation, Stress, TiN Whisker

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