Thin films of Nickel Phthalocyanine (NiPc) are prepared at a base pressure of 10-6 mbar using Organic Evaporator System. The films are deposited onto the glass substrate at various temperatures of 100 0C, 120 0C, 140 0C and 160 0C. Crystalline of NiPc thin films was investigated by X-ray diffraction (XRD) spectroscopy. XRD patterns exhibit to become aggravated crystalline films as monoclinic structure. Surface morphology of NiPc thin films was characterized by field emission scanning electron microscope (FE-SEM). FE-SEM micrographs indicate that fiber-like morphology of NiPc is enhanced with increasing substrate temperature. The optical absorption spectra of these thin films are measured. Present studies reveal that the Q-band of NiPc thin films appears as the change of electron energy level. Absorption spectra obtained from UV-vis of deposited NiPc are declined as the substrate temperature is risen.