Influence of Etching Time on Surface Structural Properties of p- and n- Type Porous Silicon Nanostructures by Photo-Electrochemical Anodic Etching

Abstract:

Porous silicon nanostructures (PSiN) are nanoporous materials which consist of uniform network of interconnected pore. The structure of PSiN is depending on etching parameters, including current density, HF electrolyte concentration, substrate doping type and level. In this work, the results of a structural p-type and n-type of porous silicon nanostructures were investigated by Field Emission Scanning Electron Microscopy (FESEM) and Atomic Force Microscopy (AFM) is reported. Samples were prepared by photo-electrochemical anodization of p- and n-type crystalline silicon in HF electrolyte at different etching time. The surface morphology of PSiN was studied by FESEM with same magnification shown n-type surface form crack faster than p-type of PSiN. While the topography and roughness of PSiN was characterize by AFM. From topography shown the different etching time for both type PSiN produce different porosity and roughness respectively. There is good agreement between p- and n-type have different in terms of surface characteristic.

• Periodical: Advanced Materials Research (Volume 576)
• Pages: 511-515
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.576.511
• Online since: October 2012
• Authors: N.A. Asli, Maslihan Ain Zubaidah, S.F.M. Yusop, Khairunnadim Ahmad Sekak, Mohammad Rusop, Saifolah Abdullah
• Keywords: AFM, FESEM, n-Type PSi, PSiT, p-Type PSi

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