Research of Double-Differenced Carrier Phase Cycle Slip Detection Based on Wavelet Analysis

Yi De Li; Zhan Feng Li; Xi Nan Li

doi:10.4028/www.scientific.net/AMR.588-589.1028

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 588-589Research of Double-Differenced Carrier Phase Cycle...

Research of Double-Differenced Carrier Phase Cycle Slip Detection Based on Wavelet Analysis

Abstract:

It is easier to develop the cycle slip phenomena during the carrier phase observation in GPS. In order to improve the reliability and accuracy of the system measurement, we need to diagnose and find out the position of the cycle slip, and then fix it before the data pretreatment stage which is ahead of the adjustment. Using the double-differenced carrier phase observables can eliminate the correlative error term and improve the accuracy of the measurement. Therefore, the essay studies the method of the double-differenced carrier phase cycle slip detection based on the wavelet analysis, and finally test the measured data. The experimental results showed that the detection of cycle slip is very sensitive when we select the suitable wavelet base.

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Periodical:

Advanced Materials Research (Volumes 588-589)

Pages:

1028-1032

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.588-589.1028

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Online since:

November 2012

Authors:

Yi De Li, Zhan Feng Li, Xi Nan Li

Keywords:

Cycle Slip Detection, Double-Differenced Carrier Phase, Signal Singularity, Wavelet Analysis

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