Recognition and Diagnosis of the Incipient Faults in Analog Circuit Using Improved HMM

Ji Jun Zhang; Deng Wu Ma; Lin Wang

doi:10.4028/www.scientific.net/AMR.588-589.843

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 588-589Recognition and Diagnosis of the Incipient Faults...

Recognition and Diagnosis of the Incipient Faults in Analog Circuit Using Improved HMM

Abstract:

Due to the uncertainties that exist in the running of the analog circuits, the traditional hidden Markov model (HMM) approach is improved through replacing the state transition probability (STP) matrix of the traditional model by time-varying one. An updating control factor is introduced for avoiding the excess updating of the STP in the initial stage of each state. The experimental results indicate that the improved HMM has better fault recognition and diagnosis capability.

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Periodical:

Advanced Materials Research (Volumes 588-589)

Pages:

843-846

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.588-589.843

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Online since:

November 2012

Authors:

Ji Jun Zhang, Deng Wu Ma, Lin Wang

Keywords:

Analog Circuit, Fault Diagnosis, Hidden Markov Model (HMM), Linear Discriminant Analysis

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