The Effect of MgO Dopant on the Dielectric Properties of CaCu₃Ti₄O₁₂ Ceramics

Abstract:

The properties of undoped and Mg-doped CaCu₃Ti₄O₁₂ (CCTO) ceramics have been studied. The samples were calcined at 900°C for 12 hours, and sintered at 1030°C for 10 hours. X-ray diffraction analysis on calcined samples shown the formation of CCTO phase with trace of secondary phases meanwhile completed formation of CCTO single phase obtained for sintered pellets. The peak positions of Mg-doped CCTO were slightly left-shifted from the undoped CCTO, attributed to the lattice expansion. Scanning electron microscopy analysis showed that the grains size becomes larger with the increment of dopant amount. Enhanced dielectric constant was observed in the Ca_1-xMg_xCu₃Ti₄O₁₂ ceramics with x = 0.05 for the frequency range from 1 MHz to 1 GHz. The dielectric loss seem to be at lowest value when Ca_1-xMg_xCu₃Ti₄O₁₂ ceramics with x = 0.10 at the same frequency range. The results indicate that Mg ions have effectively changed the properties of CCTO.

• Periodical: Advanced Materials Research (Volume 620)
• Pages: 219-223
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.620.219
• Online since: December 2012
• Authors: Mohd Fariz Ab Rahman, Julie Juliewatty Mohamed, Mohd Fadzil Ain, Sabar Derita Hutagalung
• Keywords: CaCu₃Ti₄O₁₂, Dielectric Constant, Dielectric Loss, Mg-Doped, Solid State Processing

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