Study on Bilayer-Type ZTO Thin Films Prepared by MOCVD

Ying Xu; Peng Hua Ma; Mo Ning Liu

doi:10.4028/www.scientific.net/AMR.652-654.673

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 652-654Study on Bilayer-Type ZTO Thin Films Prepared by...

Study on Bilayer-Type ZTO Thin Films Prepared by MOCVD

Abstract:

Bilayer-type ZTO thin films were prepared by MOCVD, metal organic chemical vapor deposition. As the films were investigated with UV spectrophotometer, XRD, SEM and other modern research methods, the optics and crystal properties of the ZTO thin films were researched. From the analysis of testing results, visible light transmittance of ZnO/SnO2-type film was superior to SnO2/ZnO-type film, and ternary compound, Zn2SnO4, was found in the two kinds of bilayer-type films. The priority of nucleation should emerged between the (100) crystal plane of ZnO and the (110) crystal plane of SnO2.

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Periodical:

Advanced Materials Research (Volumes 652-654)

Pages:

673-676

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.652-654.673

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Online since:

January 2013

Authors:

Ying Xu, Peng Hua Ma, Mo Ning Liu

Keywords:

Bilayer-Type ZTO Thin Films, Crystal Properties, Optics Properties

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