The Effect of Oxygen Annealing on the Resistance Switching Properties of the La0.7Ca0.3MnO3 Films
A series of La0.7Ca0.3MnO3 films are fabricated by pulsed laser deposition under controlling the oxygen partial pressure or adding an oxygen post-annealing process. The film after oxygen post-annealing shows an orientation change and has more non-lattice oxygen near the surface than those of the films without annealing. Moreover, only the structure of Ag/La0.7Ca0.3MnO3/Pt with the oxygen annealed film behaves a big current-voltage hysteresis and stable resistance switching properties by applying voltage pulse. Experimental results indicate that the increase of non-lattice oxygen content induced by oxygen annealing in the vicinity of the Ag/La0.7Ca0.3MnO3 interface contributes to the occurrence of resistance switching. And with the accurate controlling of the oxygen annealing parameters, the improvement of resistance switching property of the La0.7Ca0.3MnO3 film can be expected.
Takashi Goto, Yibing Cheng, Zhengyi Fu and Lianmeng Zhang
R. Yang et al., "The Effect of Oxygen Annealing on the Resistance Switching Properties of the La0.7Ca0.3MnO3 Films", Advanced Materials Research, Vol. 66, pp. 127-130, 2009