Research on Channel Impedance Parameters Dynamic Change Model of XCTD Profiler

Yu Zheng; Hong Zhi Li; Jie Liang; Xuan Zhao; Jing Li

doi:10.4028/www.scientific.net/AMR.662.768

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 662Research on Channel Impedance Parameters Dynamic...

Research on Channel Impedance Parameters Dynamic Change Model of XCTD Profiler

Abstract:

In order to analyze low signal-to-noise rate (SNR) of data transmission while XCTD (Expendable Conductivity, Temperature, and Depth) probe drops at several kilometers underwater, a channel impedance parameters dynamic change model is established. The analysis showed that the greater distributed capacitance between parallel wires having the greater impact on SNR in deep-water channel, improvement of wire structure and material and reduce the distributed capacitance can improve the signal to noise ratio and transmission rate significantly, and that is providing a new way to solve the problem for XCTD signal transmission.

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Periodical:

Advanced Materials Research (Volume 662)

Pages:

768-772

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.662.768

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Online since:

February 2013

Authors:

Yu Zheng, Hong Zhi Li, Jie Liang, Xuan Zhao, Jing Li

Keywords:

Distributed Capacitance, Finite Element Analysis (FEA), Spiral Inductors, XCTD Profile

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References

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DOI: 10.1109/20.767144

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