Convenient Calibration Procedure for Structured Light Projection System

Wen Guo Li; Shao Jun Duan

doi:10.4028/www.scientific.net/AMR.662.777

Paper Titles

A Design of Turbidimetry Based Rapid Microbiology Detector
p.758

Study of Free Length Detection for Bolster Spring of Railroad Tracks
p.762

Research on Channel Impedance Parameters Dynamic Change Model of XCTD Profiler
p.768

TPMS Test Management System Based on Wireless Sensor Network
p.773

Convenient Calibration Procedure for Structured Light Projection System
p.777

Process-Monitor’s Multimodal Optimization with Dynamic Cloning Based Immune Network Algorithm
p.781

Study of Liquid Single Particle Size Detection Based on Lateral Scattering Technique
p.788

Anticontrol of Chaos for a Stable Permanent Magnet Synchronous Motor System via Time-Delay Feedback
p.797

A New Approach to Robust and Non-Fragile Control of Uncertain T-S Fuzzy Systems with Interval Time-Delay
p.801

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 662Convenient Calibration Procedure for Structured...

Convenient Calibration Procedure for Structured Light Projection System

Abstract:

We present a convenient calibration method for structured light projection system. The proposed clibration approach can realize 3D shape measurement without projector calibration, without system calibration, without precise linear z stage to be used, the relative position between camera and projector can be arbitrary, and the only involved device is a plane board. Experiment results validated that the accuracy of the proposed approach.

You might also be interested in these eBooks

Nanotechnology and Precision Engineering

View Preview

Info:

Periodical:

Advanced Materials Research (Volume 662)

Pages:

777-780

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.662.777

Citation:

Cite this paper

Online since:

February 2013

Authors:

Wen Guo Li, Shao Jun Duan

Keywords:

3D Shape Measurement, Calibration, Polynomial Interpolation, Structured Light Projection

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] J. Gühring, C. Brenner, J. Böhm, and D. Fritsch: Data processing and calibration of a cross-pattern stripe projector. ISPRS Congress 2000, APRS 33(5).

Google Scholar

[2] C. Brenner, J. Böhm, and J. Gühring: Videometrics VI Conf., S. F. ElHakim and A. Gruen, Eds., Proc. SPIE 3641 (1998), p.164.

Google Scholar

[3] H. Liu, W. Su, K. R. Yin, and S. Yin: Opt. Commun. 216 (2003), p.65.

Google Scholar

[4] G. Sansoni, M. Carocci, and R. Rodella: Appl. Opt. 38 (1999), p.6565.

Google Scholar

[5] T. Koninckx and L. Van Gool: Proc. SPIE 5013 (2003), p.26.

Google Scholar

[6] Zhang Xiaoling, Lin Yuchi, Zhao Meirong, Niu Xiaobing and Huang Yinguo: J. Opt. A: Pure Appl. Opt. 7 (2005), p.192.

DOI: 10.1088/1464-4258/7/4/007

Google Scholar

[7] Hongwei Guo, Haitao He, Yingjie Yu and Mingyi Chen: Optical Engineering 44(3) (2005), p.033603.

Google Scholar

[8] Ming-June Tsai and Chuan-Cheng Hung: Measurement 38 (2005), p.236.

Google Scholar

[9] Hongyu Liu, Wei-Hung Su, Karl Reichard, Shizhuo Yin: Optics Communications 216 (2003), p.65.

Google Scholar

[10] Song Zhang, Peisen S. Huang: Optical Engineering 45(8) (2006), pp.083601-1.

Google Scholar

[11] G. Sansoni, M. Carocci, R. Rodella: IEEE Trans. Instrument. Measure. 49(3) (2000), p.628.

Google Scholar

[12] H. Liu, B.A. Bard, G. Lu, S. Wu: SPIE Proceedings of Optical Manufacturing and Testing III, vol. 3782 (1999), p.190.

Google Scholar

[13] G. Sansoni, L. Biancardi, U. Minoni, F. Docchio: IEEE Trans. Instrument. Measure. 43 (4), (1994), p.558.

Google Scholar

[14] S.Y. Chen, Y.F. Li: Measure. Sci. Technol. 14 (2003), p.33.

Google Scholar

[15] C. Sinlapeecheewa, K. Takamasu: IEEE ICIT(02) (2002).

Google Scholar

[16] Z. Zhang: Pattern Anal. Mach. Intell. 22(11) (2000), p.1330.

Google Scholar