Volume is indexed by Thomson Reuters CPCI-S (WoS).
Selected, peer reviewed papers from the International Conference on Nanotechnology and Precision Engineering (ICNPE 2012), December 18-19, 2012, Guangzhou, China. This 2 volumes set is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. This volume also includes the applications of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science.

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Info:

eBook:

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ToC:

Table of contents

Editors:

Prof. Zheng Yi Jiang and Prof. Yun Hae Kim

DOI:

https://doi.org/10.4028/b-Co62FK

THEMA:

PDT, TGM

BISAC:

TEC021000

Keywords:

Computer Application, Detection Technology, Education, Image Processing Application, Management, Materials Processing, Measurement Technology, Modeling, Nanomaterials, Nanotechnology, Precision Engineering, Product Design, Sensor Technology, Simulation, Technologies of Manufacturing Processes

Details:

Selected, peer reviewed papers from the International Conference on Nanotechnology and Precision Engineering (ICNPE 2012), December 18-19, 2012, Guangzhou, China

Pages:

1050

Book Set:

2 Books set

Year:

2013

ISBN-13 (softcover):

9783037856406

ISBN-13 (CD):

9783037954096

ISBN-13 (eBook):

9783038260219

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