Dielectric Nano-Systems with Unique Optical Properties

Abstract:

The study of optical properties of Al₂O₃, SiO₂, TiO₂, and ZnO nanoparticles in weak optical fields is presented. We found that some nanoparticles have unique optical nonlinearity: The values of portions to nanoparticle refractive index and absorption coefficient increase to maxima, and then decrease to zero when the radiation intensity changes from 1 to 500 W/cm2. We estimated electron energy structures of nanoparticles and experimentally determined that such nonlinearity is directly related to peculiarities of the energy structure. We obtained a good fitting of theoretical results to the experimental ones (e.g. absorbance spectra of nanoparticles; the dependence of nanoparticle refractive index and absorption coefficient on radiation intensity).

• Periodical: Advanced Materials Research (Volume 677)
• Pages: 36-41
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.677.36
• Online since: March 2013
• Authors: Yurii N. Kulchin, Vladimir P. Dzyuba, Valentin A. Milichko
• Keywords: Dielectric Nanoparticles, NONLINEAR OPTICS, Optical Spectroscopy

References

[1] M.S. Anderson: Applied Physics Letters 83(14) (2003), p.2964.

[2] O.P. Miheev and A.I. Sidorov: Technical Physics 74(6) (2004), p.77.

[3] Yu.N. Kulchin, A.V. Shcherbakov, V.P. Dzyuba, S.S. Voznesenskii and G.T. Mikaelyan: IOP Quantum Electronics 38(2) (2008), p.154.

[4] V. Dzyuba, V. Milichko and Yu. Kulchin: Journal of Nanophotonics 5 (2011), 053528.

[5] D. Kousik and S.K. De: Journal of Nanoparticle Research 9 (2007), p.631.

[6] D. Chu, X. Yuan, G. Qin, M. Xu, P. Zheng, J. Lu and L. Zha: Journal of Nanoparticle Research 10 (2008), p.357.

[7] G. Pellegrini, G. Mattei and P. Mazzoldi: ACS Nano 3(9) (2009), p.2715.

[8] J. Han, B.K. Woo, W. Chen, M. Sang, X. Lu and W. Zhang: The Journal of Physical Chemistry C 112 (2008), p.17512.

[9] F.C. Chen, C.W. Chu, J. He, Y. Yang and J.L. Lin: Applied Physics Letters 85(15) (2004), p.3295.

[10] M. Wakaki, K. Kudo and T. Shibuya: Physical Properties and Data of Optical Materials (CRC Press Taylor and Francis Group, New York 2007).

[11] E. Mosconi, A. Selloni and F. De Angelis: The Journal of Physical Chemistry C 116 (2012), p.5932.

[12] S.I. Pokutnyi: Semiconductor 40(2) (2006), p.217.

[13] N.S. Han, H.S. Shim, J.H. Seo, S.Y. Kim and S.M. Park: Journal of Applied Physics 107 (2010), 084306.

[14] E.W. Van Stryland and M. Sheik-Bahae, in: Characterization Techniques and Tabulation for Organic Nonlinear Materials, edited by M. G. Kuzyk and C. W. Dirk/Marcel Dekker Inc. New York (1998), p.655.

[15] V.P. Dzyuba, A.E. Krasnok, Yu.N. Kulchin and I.V. Dzyuba: Semiconductor 45(3) (2011), p.295.

[16] V.P. Dzyuba, A.E. Krasnok and Yu.N. Kulchin: Technical Physics Letters 36(11) (2010), p.973.