Combination of Digital Speckle Pattern Interferometry and Digital Image Correlation for 3-D Deformation Measurement

Abstract:

This paper refers to two whole-field , non-contact experimental techniques：Digital Speckle Pattern Interferometry (DSPI) and Digital Image Correlation (DIC). The former can measure 3-D deformations in nanometric level. The latter can measure small displacement in micrometric level. DSPI needs a phase-shifting setup and rotating the whole device for 3-D deformation measurement. Two CCD cameras will be required recording speckle image simultaneously for 3-D measurement by DIC method. An optical system which is a combination of the two measurement method is proposed in this paper. Digital image correlation setup using one CCD camera for in-plane measurement and digital speckle pattern interferometric setup for out-plane measurement constitutes this measurement system. Three dimensions information of deformation can be recorded simultaneously by one 3-color CCD camera. This system can be used to measure deformation with a small out-plane component and a relatively larger in-plane component.

• Periodical: Advanced Materials Research (Volume 677)
• Pages: 406-411
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.677.406
• Online since: March 2013
• Authors: Xing Hua Chai, Xiao Ping Lou, Nai Guang Lv
• Keywords: Deformation Measurement, Digital Image Correlation (DIC), Digital Speckle Pattern Interferometry

References

[1] Basanta Bhaduri, in: Two wavelength simultaneous DSPI and DSP for 3D displacement field measurements, Optics Communication 284, 2437-2440(2012).

DOI: 10.1016/j.optcom.2011.01.036

[2] Lianxiang Yang, in: Advanced Optical Methods for Whole Field Displacement and Strain Measurement, (2010).

[3] Rafael C. Gonzales, Richard E. Woods, in: Digital Image Processing, Prentice Hall Upper Saddle River, NJ(2002).

[4] Shih-Heng Tung, in: Precision verification of a simplified three-dimensional DIC method, Optics and Lasers in Engineering 49, 937-945(2011).

DOI: 10.1016/j.optlaseng.2011.02.006

[5] Bing Pan, in: An active imaging digital image correlation method for deformation measurement insensitive to ambient light, Optics & Laser Technology 44, 204-209(2012).

DOI: 10.1016/j.optlastec.2011.06.019

[6] C.J. Tay, C. Quan, Y.H. Huang, in: Digital image correlation for whole field out-of-plane displacement measurement using a single camera, Optics Communication 251, 23-36(2005).

DOI: 10.1016/j.optcom.2005.02.070

[7] C.J. Tay, C. Quan, in: A new method for phase extraction from a single fringe pattern, Optics Communication 239. 251-358(2004).

DOI: 10.1016/j.optcom.2004.05.046

[8] Joseph W. Goodman, in: Speckle Phenomena in Optics：Theory and Applications Ben Robert & Company Publication(2007).

[9] K.D. Hinsch, in: Speckle correlation for the analysis of random processes at rough surfaces Optics and Lasers in Engineering 33, 87-105(2000).

DOI: 10.1016/s0143-8166(00)00035-x