Combined Improved EEMD with SVM in the Application of Intellgent Fault Diagnosis

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Abstract:

Intelligent diagnosis is the development direction of mechahnical condition monitoring and fault diagnosis.Conbined improved EEMD with SVM in fault intelligent diagnosis is researched in this paper.To bearing normal and fault as an example,impove EEMD decomposed 9D normalized energy for characteristic vector applied to the binary classification and identification.Compared to the SVM classification accuracy using different kernel functions that is linear,polynomial,RBF and Sigmoid kernel function.In the same parameters,SVM classification accuracy based on linear and polynomial kernel function is a hundred percent.Bearing normal and fault two kinds of state is completely correct apart. And the normal and fault state of the binary classification and identification using RBF and Sigmoid kernel function appeared wtong points.

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Periodical:

Advanced Materials Research (Volumes 706-708)

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1774-1777

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Online since:

June 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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