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Preparation of TEM Specimens from Gas-Atomized Fe-6.5wt.%Si Powders with Several Micrometers Using Focused Ion Beam

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Abstract:

Transmission electron microscopy (TEM) can be utilized to identify some specific microstructures of metals and alloys. However, it is very difficult to precisely prepare a TEM specimen from the powder particles with several micrometers. There are more or less drawbacks in conventional preparation method. This paper describes a novel method to prepare specific specimens from the powder particles with several micrometers for TEM study. A TEM specimen approximately 5μm diameter was successfully prepared to electron transparency, which extracted from a 5μm diameter powder particle. The selected-area electron diffraction pattern (SAED) analysis was carried out.

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Periodical:

Advanced Materials Research (Volumes 706-708)

Pages:

224-229

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.706-708.224

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Online since:

June 2013

Authors:

Shi Chao Zhao, Ke Xie, Chang Jiang Song, Qi Jie Zhai

Keywords:

Gas-Atomized Powder, Microstructure, TEM Specimen Preparation

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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