An Novel Binarization Algorithm Based on Wavelet and an Optimal Box Counting Fractal Dimension for MEMS Measurement

Abstract:

In MEMS parameter measure based on vision,the process of binarization is critical. In the situation of unbalancing illumination and noise background,the performance of traditional binarization method degrades. In this paper, a binarization method based on wavelet analysis and an optimal box counting (OBC) fractal dimension algorithm is proposed. At first,wavelet analysis is used to eliminate the effect of illumination distribution.Then the MEMS image binarization based on OBC reduces the effect of noise. Experiments show that, the method can get a considerable binarization result.

• Periodical: Advanced Materials Research (Volumes 718-720)
• Pages: 1094-1099
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.718-720.1094
• Online since: July 2013
• Authors: Yuan Luo, Xue Qiang Tang
• Keywords: Binarization, Fractal Dimension, MEMS, Optical Box Counting Algorithm, Wavelet

References

[1] Xiaohui Chen, Research on the major problems of the analysis and evaluation of functional characteristics of microstructures of MEMS, Huazhong University of Science & Technology, Wuhan, 2011.

[2] Qinxu Jiang, Ping Li, Lan Sun, Application of Otsu method in motion detection system, Journal of Computer Applications, Dalian, 2011, p.31(1):260-262.

DOI: 10.3724/sp.j.1087.2011.00260

[3] Yiquan Wu, jiaming Wu, Bichao Zhan, An Effective Method of Threshold Seclection for Small Object Image, ACTA ARMAMENTAII, Nanjing, 2011,p.32(4):469-475.

[4] Shuangping Zhao, Xiangwei Li, Jinghong Xing, Gang Zheng, An wavelet image automatic threshold selection denoising method, Advanced Materials Research, Xiamen, p.2012:780-783.

DOI: 10.4028/www.scientific.net/amr.482-484.780

[5] Yuan Luo, Yi Zhang, Xiaodong Xu, Topography of micromirror for metal MEMS optical switch based on fractal theory,SPIE, 6724, 2007, pp.672-675.

[6] Xiang Xiong, Yan Zhou, Jianxin Zhu, Fractal Analysis of the wear in Micro-electro-mechanical Systems(MEMS), Lubrication Engineering. 2008, p.33(6):675-679.

[7] Holtkmap David J, Goshtasby A Ardeshir. Precision Registration and Mosaicking of Multi-camera Image, IEEE Transactions on Geoscience and Remote Sensing , 2009, p.47(10):3446-3455.

DOI: 10.1109/tgrs.2009.2023114

[8] Curtis, D.B. Evaluating binarization techniques for optical character recognition, Arlington, VA, United states, ISandT Archiving 2007 Conference. 2007, pp.110-112.

[9] Jiapeng Wu, Zhaoxuan Yang, Dong Han, Zhuofu Bai, Yuting Su, 2D Barcode Image Binarization Based on Wavelet and Otsu Method, Computer Engineering Tianjin, 2010, p.36(10) 190-192.

DOI: 10.1109/iccasm.2010.5619380

[10] Marc Khoury,Rephael Wenge.On the Fractal Dimension of Isosurfaces, IEEE Transactions on Visualization and Computer Graphics.2010, p.16(6):1198-1205.

DOI: 10.1109/tvcg.2010.182

[11] Chuanlong Li, Ying Li, Shuiming Yu, New Fractal Model of Grid Overlapping Differential Box-counting, Computer Science, Dalian, 2011, p.38(1) 282-285.

[12] Wei Gang, Tang Ju, Study of Minimum Box-Counting Method for image fractal dimension estimation, Proc of IEEE International conference on Electricity Distribution.2008.1-5.

DOI: 10.1109/ciced.2008.5211829

[13] Ping Kong, Guangle Yan, Qin Dai, Guiju Fan, Binarization methods of license plate recognition based on fractal dimension, Computer Engineering and Applications, 2007, p.43(30) 184-185.