Test of 32-Channel X-Ray Readout Integrated Circuit

Liu Dan; Gao Feng; Jin Chuan

doi:10.4028/www.scientific.net/AMR.718-720.1100

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 718-720Test of 32-Channel X-Ray Readout Integrated...

Test of 32-Channel X-Ray Readout Integrated Circuit

Abstract:

The test method of 32 channel X-ray readout integrated circuit (ROIC) has been proposed in this paper. Large resistors and a voltage source with high accuracy are used to generate 32 channels of weak currents, which are injected into the ROIC. Some key parameters of ROIC such as linearity, uniformity, cross talk, dynamic range have been tested. This method helps to test ROICs performance and does not need any photodiode and any laser light, which is convenient and easy to be realized.

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Periodical:

Advanced Materials Research (Volumes 718-720)

Pages:

1100-1103

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.718-720.1100

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Online since:

July 2013

Authors:

Liu Dan, Gao Feng, Jin Chuan

Keywords:

Crosstalk, Dynamic Range, Electronic Test, Linearity, X-Ray ROIC

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References

[1] Li Yangjun, Wu Jingzhi, "Research on the Portable Medical X-ray Detection Technology", 6th International Symposium on Test and Measurement . (2005) 4996-4998.

Google Scholar

[2] J. C. Stanton, "A Low Power Low Noise Amplifier for A 128 Channel Detector Read-out Chip", IEEE Transactions on Nuclear Science. (1989) 522-527.

DOI: 10.1109/23.34494

Google Scholar

[3] Zhangming Zhu, Yintang Yang and Qinchao Meng,"A Low Noise Si-CMOS Amplifier-Multiplexer Readout Circuit Array for Imaging Application", IEEE. (2006)629-633.

DOI: 10.1109/icsict.2006.306397

Google Scholar

[4] Jose Moreria, "Development of an ATE Test Cell for At-Speed Characterization and Production Testing", International Test Conference. (2011)1-10

Google Scholar

[5] Liu Dan, Gao Feng, Jin　Chuan,"High Linearity 32-channel CMOS X-Ray Readout Integrated Circuit", 2010 Symposium on Security Detection and Information Processing.(2010)213-216

DOI: 10.1016/j.proeng.2010.11.033

Google Scholar

[6] Liudan, Lu Wengao,Chen Zhongjian, et al,"Low Power Design Orienting 384´288 Snapshot Infrared Readout Integrated Circuit",Journal of Semiconductor. (2008) 93-98.

Google Scholar

[7] Chen Zhongjian, Lu Wengao, Tang Ju,et al, "Study on Test Method of TDI Function for Infrared Focal Plane Array CMOS Readout Circuits", J. Infrared Millim. Waves. (2008)342-345

DOI: 10.1109/icsict.2008.4734896

Google Scholar

[8] http:// www.deetee.com

Google Scholar