Fabrication and Calibration of a Thin Film Heat Flux Sensor

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Abstract:

In order to measure heat flux in micro scale space, a thin film heat flux sensor is designed, fabricated and calibrated. Vacuum coating technology is applied to fabricate the sensor with a total thickness of 0.49μm. Silicon dioxide wafer is used as substrate. Cobalt and stibium is deposited on the substrate to form thermopile. Correlation coefficient R is 0.94025. Sensitivity of the heat flux sensor is 0.05062 μV/(W/m2). Time constant of the sensor is 0.66044 seconds. Dynamic test shows that the heat flux sensor responds rapidly to periodic heat flux which is supplied by halogen lamp.

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Advanced Materials Research (Volumes 718-720)

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1181-1184

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July 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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