Multi-Angle Digital Holographic Profilometry for Precision Measurements

Article Preview

Abstract:

A novel digital holographic interferometry used for measuring the 3D shape is proposed. The theory analysis and simulation of multi-angle interferometry are described. General holographic interferometry are not able to measure the discontinuous object because of the phase unwrapping. However, in this method, holographic interferograms are generated by object beam and reference beam with different incident angles. Height information of every point at the object surface is extracted independently without the phase unwrapping. The results of simulation demonstrate that this method can be used for measuring the complicated and discontinuous object. It will be useful for the measuring the large and complex discontinuous surfaces often exist in mechanical machining.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 718-720)

Pages:

415-419

Citation:

Online since:

July 2013

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Y. Y. Hung, L. Lin and B. G. Park, Practical three-dimensional computer vision techniques for full-filed surface measurement, Optical Engineering. 39(1) 143-149, 2000.

DOI: 10.1117/1.602345

Google Scholar

[2] Z H Huang, Albert J. shih and Jun Ni, Laser interferometry hologram registration for three-dimensional precision measure, Journal of Manufacturing Science and Engineering. 2006, 128:1006-1011.

DOI: 10.1115/1.2335856

Google Scholar

[3] U. Paul Kumar, Basanta Bhaduri and M. P. Kothiyal. Two-wavelength micro- interferometry for 3-D surface profiling. Optics and Lasers in Engineering, 2009, 47: 223–229.

DOI: 10.1016/j.optlaseng.2008.04.005

Google Scholar

[4] Carl C. Aleksoff. Multi-wavelength digital holographic metrology. Proceeding of SPIE, 2006, 6311:63111D.

Google Scholar

[5] Joseph C. Marron, Kurt W. Gleichman. "Three-dimensional imaging using a tunable laser source", Optical Engineering, 2000, 39(1): 47-51.

DOI: 10.1117/1.602334

Google Scholar