Machine Vision Inspection of In Vitro Diagnostic Kits

Abstract:

A machine vision-based inspection system was proposed to inspect the defects of in-vitro diagnostic kits in the production line. The proposed system consisted of two sub-systems, which inspect the strip surface defects and strip assembly defects respectively. The procedure to inspect five types of major defects was determined by the application of image processing and analysis techniques such as image enhancement, edge detection, threshold segmentation, and morphology. The proposed system was implemented using 300 defect samples. Experimental results show the proposed system is effective and efficient.

• Periodical: Advanced Materials Research (Volumes 753-755)
• Pages: 2164-2169
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.753-755.2164
• Online since: August 2013
• Authors: Jiang Ping Mei, Yi Liu
• Keywords: Automatic Inspection, Defect Inspection, In Vitro Diagnostic Kit, Machine Vision

References

[1] S. Gao, B. Sun, S. Qu: Chinese Journal Of Pharmaceutical Analysis, Vol. 26(2006) No. 8, p.1175 (In Chinese).

[2] T.H. Sun, C.C. Tseng, M.S. Chen: Image and Vision Computing, Vol. 28 (2010) No. 6, p.890.

[3] C.S. Lin, C.Y. Wu, H.C. Hsu, et al: Optik-International Journal for Light and Electron Optics, Vol. 115 (2004) No. 8, p.363.

[4] C.S. Lin, Y.C. Chen, M.C. Tang, et al: Optik, Vol. 119 (2008) No. 10, p.485.

[5] C.S. Lin, Y.Y. Su, H.J. Shei, et al: Sensor Review, Vol. 31 (2011) No. 2, p.166.

[6] S. Kenji, H. Isao, S. Noboru: Computer Vision and Image Understanding, Vol. 89 (2003) No. 1, p.1.