Reduce Cycle Time at Semiconductor Assembly Test Manufacturing with Factory Physics Methodology

Xiong Fei; Yao Jin

doi:10.4028/www.scientific.net/AMR.753-755.3166

Paper Titles

Solutions for a Class of the Exponential Diophantine Equation
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Interdisciplinary Physical Cluster for Environmental Engineers Training
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The Evaluation of Industry Development Policies of Chinas Five-Year Plan
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Dangerous and Harmful Factors in the Process of Open-Pit Mine Production and Prevention Countermeasures
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Reduce Cycle Time at Semiconductor Assembly Test Manufacturing with Factory Physics Methodology
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Design and Application of Students’ Learning Mode in Science and Engineering Universities under ESP Environment
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Research on Higher Technical Education Meets the Demands for Talents in Equipment Manufacturing Industry in China
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Application of the Basic Object in the Teaching Process of Engineering Drawing
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Research of Remote Monitor System for Agriculture Equipment Based on Embedded System and Wireless Network
p.3181

HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 753-755Reduce Cycle Time at Semiconductor Assembly Test...

Reduce Cycle Time at Semiconductor Assembly Test Manufacturing with Factory Physics Methodology

Abstract:

Through a systematic and scientific manufacturing process approach of building awareness for the importance of cycle time improvement, providing the organization with knowledge on how to improve the manufacturing performance and then taking action on that knowledge. This paper will share how ATM made these incredible improvements in such a short time period by introducing factory physics concepts and rigorously applying them throughout the 9 months. Semiconductor Assembly Test Manufacturing (ATM) reduced cycle time by 35-70% in less than 1 year for semiconductor products. The results demonstrate the significant progress ATM has made in improving the effectiveness of the manufacturing by using Factory Physics (FP) concepts rather than relying on intuition.