Study of Nano-Mechanical Characterization of Minimum Chip Formation Using Atomic Force Microscopy

Fei Fei Zhao

doi:10.4028/www.scientific.net/AMR.756-759.12

Paper Titles

Preface

The Influence of Nitrogen on the Chlorophyll Fluorescence Parameters of Lettuce
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Research on Influence Factors for Loosing Performance of Cotton Loosing Machine for Long Fiber PP Cotton
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Study of Nano-Mechanical Characterization of Minimum Chip Formation Using Atomic Force Microscopy
p.12

Four Flavonoid Glycosides from the Pulps of Elaeagnus angustifolia and their Antioxidant Activities
p.16

Preparation of Ni-Mn-Zn Ferrite Films on CeO₂/YSZ-Buffered Si Substrate
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Reliability-Based Balanced Condition for Strengthened RC Beams
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Effect of Cuing Conditions on the Microstructural Characteristics of Complex Binders
p.29

The Development and Application of Object-Oriented Finite Element Analysis System for Sheet Metal Forming
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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 756-759Study of Nano-Mechanical Characterization of...

Study of Nano-Mechanical Characterization of Minimum Chip Formation Using Atomic Force Microscopy

Abstract:

Derived the approximate relationship between minimum cutting thickness and tip radius, ratio of vertical load and shear force, friction coefficient between tip and sample. Wire was being processed by changing the load size. The critical load of chip formation and machining thickness were found from atomic force scan picture. Contrast tests were done by transforming the specimen. The experimental results are basically consistent with the derived values.

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Periodical:

Advanced Materials Research (Volumes 756-759)

Pages:

12-15

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.756-759.12

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Online since:

September 2013

Authors:

Fei Fei Zhao

Keywords:

Atomic Force Microscope (AFM), Minimum Thickness of Cut, Nanoscratch

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References

[1] Qi Yongyue, Zhao Meirong, Lin yuchi. Current status and Prospect of nanometer measurement system [J]. Chinese Journal of scientific instrument, 2003 August.

Google Scholar

[2] Summer Jiafei, Sun Tao, Yan Yongda, Liang Yingchun, Dong Shen. Study on the atomic force microscope ( AFM ) micro processing system [J]. optics and precision engineering, 2003, 11 (2) : 125~129.

Google Scholar

[3] S. Shinmada, N. Ikawa. Feasibility Study on Ultimate Accuracy in Microcutting Using Molecular Dynamics Simulation[J]. Annals of the CIPP, 1993, 42: 91~94.

DOI: 10.1016/s0007-8506(07)62399-3

Google Scholar

[4] Yuan Zhejun, Wang Xiankui. Precise and Ultra-precision Processing Technology[M]. Mechanical Industry Press. 2005：21~23.

Google Scholar

[5] Yan Yongda. The Study of Nano Machining Mechanism and Related Technology based on AFM. Harbin Industrial University, Ph.D. Dissertation. 2007：74~79.

Google Scholar

[6] Zhu Ying, Yao Yingxue, Zhou Liang. Research and test of [J]. nano indentation technique tool technology, 2004, 38 ( 8 ) : 13~16.

Google Scholar

[7] Zhao Qingliang, Liang Yingchun, Cheng Kai, Dong Shen. The micromachined silicon surface nanoindentation measurement and analysis of [J]. based on AFM micro electronic technology, 2003, 7/8: 241~244.

Google Scholar