Abrasive Surfaces Measured by Digital Optical Stereopsis

Dennis V. de Pellegrin; Andrew Torrance

doi:10.4028/www.scientific.net/AMR.76-78.465

Paper Titles

Blasting of Affected Layer of Silicon Surface Sliced by Wire EDM
p.440

Modeling and Analysis of Effects of Machine Tool Stiffness and Cutting Path Density on Infeed Surface Grinding of Silicon Wafer
p.445

Processing Grinding-Damaged Silicon Wafers by High-Frequency Nano-Second Laser Irradiation
p.451

Measuring Surface Uniformity in Chemical Mechanical Polishing
p.459

Abrasive Surfaces Measured by Digital Optical Stereopsis
p.465

The Effect of Cooling Lubrication Methods on Surface Roughness Measured by the White Light Interferometer
p.471

Fabrication of Aspheric Micro Lens Array by Slow Tool Servo
p.479

Fundamentals of BK7 Glass Removal in Micro/Nano-Machining
p.485

The Experimental Research on Small Hole Machining in Glass Using Diamond Abrasive Core-Tools
p.491

HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 76-78Abrasive Surfaces Measured by Digital Optical...

Abrasive Surfaces Measured by Digital Optical Stereopsis

Abstract:

The principle of stereopsis involves measuring an object’s geometry from a pair of images taken at slightly different viewing positions. This technique is frequently used for geographical mapping in satellite-based reconnaissance, however, the same practice has not been reliably applied at the other end of the scale spectrum: i.e. optical microscope imaging. The impediments have been identified and addressed in this work, concluding that optical stereopsis can be applied to microscopical surface examinations, and that the resulting digital elevation models can be of particular use in tribological investigations for performance and failure analysis.

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Periodical:

Advanced Materials Research (Volumes 76-78)

Pages:

465-470

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.76-78.465

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Online since:

June 2009

Authors:

Dennis V. de Pellegrin, Andrew Torrance

Keywords:

Abrasive, Measurement, Stereopsis, Surface

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