Evaluation of GMR Head Durability against Nanoscale Scratches Using High-Field Transfer Curves

Hideaki Tanaka; Hiromu Chiba; Yukio Maeda

doi:10.4028/www.scientific.net/AMR.76-78.520

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 76-78Evaluation of GMR Head Durability against...

Evaluation of GMR Head Durability against Nanoscale Scratches Using High-Field Transfer Curves

Abstract:

We investigated the durability of giant magnetoresistive (GMR) heads to nanoscale scratches created during the lapping process. Analysis using high-field transfer curves after deliberate scratching with an atomic force microscope (AFM) identified changes in the magnetization of the head and a reduction in pinning strength, which is a magnetic performance indicator. Additionally, finite element method (FEM) analysis suggested that the overall effects on the GMR head following nanoscale scratching increased with scratch depth.

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Periodical:

Advanced Materials Research (Volumes 76-78)

Pages:

520-525

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.76-78.520

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Online since:

June 2009

Authors:

Hideaki Tanaka, Hiromu Chiba, Yukio Maeda

Keywords:

Atomic Force Microscope (AFM), Durability, Fixed-Abrasive, GMR, Lapping, Magnetic Head, Pinning

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