Optical Surface Cleanliness Inspection, Degradation and Maintaining in High Power Laser System

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Abstract:

High Power Laser System (HPLS) is a large optical instrument, provides extremely high temperature and pressure conditions for inertial confinement fusion (ICF) and high-energy-physics research. It contains large number of optics and which would be easily damaged due to high fluence of laser power. The contamination control of optical surfaces has a great significance to ensure the performance of the system and decrease costs. This paper discussed the background and development of cleanliness control techniques in high power laser systems, including contamination induced laser damage (CILD), contamination inspection, optical surface cleanliness degradation and maintaining.

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Advanced Materials Research (Volumes 765-767)

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2288-2293

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September 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] M.D. Feit, A.M. Rubenchik, D.R. Faux, et al. Modeling of Laser Damage Initiated by Surface Contamination. SPIE, Vol. 2966(1997), p.417.

Google Scholar

[2] M.D. Milier, R. Chow, G.E. Loomis. Electrostatic reduction of particulates for laser resistant hafnia coatings (Report). LLNL, 1993 No. UCRL-JC-114845.

Google Scholar

[3] R.P. Gonzales, D. Milam. Evolution during multiple-shot irradiation of damage surrounding isolated platinum inclusions in phosphate laser glass (Report). Laser-Induced Damage in Optical Materials, NBS, (1985).

DOI: 10.1520/stp18734s

Google Scholar

[4] F.Y. Génin, M.R. Kozlowski, M.D. Feit. Contamination Effects on Optical Damage (Report). LLNL, 1998 No. UCRL-ID-130003.

Google Scholar

[5] F.Y. Génin, K. Michlistch, J. Furr, et al. Laser-Induced Damage of Fused Silica at 355 and 1064 nm Initiated at Aluminum Contamination Particles on the Surface (Report). LLNL, 1997 No. UCRL-JC-124878.

DOI: 10.1117/12.274242

Google Scholar

[6] F.E. Hovis, B.A. Shepherd, C.T. Radcliffe, et al. Mechanisms of contamination-induced optical damage in lasers. Laser-Induced Damage in Optical Materials, SPIE, Vol. 2428(1994), p.72.

DOI: 10.1117/12.213736

Google Scholar

[7] S.C. Sommer, I.F. Stowers, et al. Clean Construction Protocol for the National Ignition Facility Beampath and Utilities (Report). LLNL, 2001 No. UCRL-JC-145251.

DOI: 10.17764/jiet.46.1.k8r243r02m3w5547

Google Scholar

[8] H. Bercegol, P. Bouchut, L. Lamaignere, et al. The impact of laser damage on the lifetime of optical components in fusion lasers. Proc. SPIE, Vol. 5273(2004), p.312.

DOI: 10.1117/12.524843

Google Scholar

[9] I.F. Stowers, J.A. Horvath, J.A. Menapace, et al. Achieving and maintaining cleanliness in NIF amplifiers. Third International Conference on Solid State Lasers for Application to Inertial Confinement Fusion, SPIE, Vol. 3492(1999), p.609.

DOI: 10.1117/12.354175

Google Scholar

[10] I.F. Stowers. Optical Cleanliness Specifications and Cleanliness Verification. Optical Manufacturing and Testing III, SPIE, Vol. 3782(1999), p.525.

DOI: 10.1117/12.369233

Google Scholar

[11] W.H. Gourdin, E. Dzentitis, D. Martin, et al. In-situ debris inspection and removal system for upward-facing transport mirrors of the National Ignition Facility. Laser-Induced Damage in Optical Materials, Proc. of SPIE, Vol. 5647(2005), p.107.

DOI: 10.1117/12.585077

Google Scholar

[12] R. Chow, R. Bickel, J. Ertel, et al. Cleanliness Validation of NIF Small Optics (Report). LLNL, 2002 No. UCRL-JC-146400.

Google Scholar

[13] I.F. Stowers, D.L. Ravizza. The Particle Cleanliness Validation System (Report). LLNL, 2001 No. UCRL-JC-145932.

Google Scholar

[14] G.M. Bilmes, D.J.O. Orzi, O.E. Martínez, et al. New method for real time surface cleanliness measurement. Optical Measurement Systems for Industrial Inspection IV, SPIE, Vol. 5856(2005), p.980.

DOI: 10.1117/12.612664

Google Scholar

[15] J. v. d. Donck, R. Snel, J. Stortelder, et al. Particle detection on flat surfaces. Extreme Ultraviolet (EUV) Lithography II, Proc. of SPIE, Vol. 7969(2011), p.1.

DOI: 10.1117/12.879435

Google Scholar

[16] H.Y. Chu, Z.J. Xie, Y.H. Shao, et al.: Modern Scientific Instruments Vol. 3 (2010), p.17. (In Chinese).

Google Scholar

[17] H.W. Yu, W.G. Zheng, J. Tang, et al.: High Power Laser and Particle Beams Vol. 13-3 (2001), p.272. (In Chinese).

Google Scholar

[18] X.F. Cheng. Research on technique for high power solid-state lasers (Vol. 3) Pilot Study on Prototype Target Beam Tube Cleaning and Contaminating Mechanism (Report). CAEP, 2008 No. GF-A0094665G. (In Chinese).

Google Scholar

[19] J.C. Tan, F. Jing, Q.H. Zu, et al.: High Power Laser and Particle Beams Vol. 12-2 (2000), p.159. (In Chinese).

Google Scholar

[20] A.C. Tam, W. Zapka, W. Ziemlich: Journal of Applied Physics Vol. 71-7 (1992), p.3514.

Google Scholar