Analysis and Research on Accelerated Storage Reliability of Electronic Devices

Zhi Ling Peng

doi:10.4028/www.scientific.net/AMR.765-767.2448

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 765-767Analysis and Research on Accelerated Storage...

Analysis and Research on Accelerated Storage Reliability of Electronic Devices

Abstract:

On the basis of analysis of electronic equipment failure modes, Put forward the initial failure of the accelerated storage reliability model of electronic equipment, Related theory. Related theory, Accelerated storage of electronic equipment reliability prediction model is established and solved. Provides a reliable means for the accurate prediction of storage reliability to be determined under storage conditions.

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Periodical:

Advanced Materials Research (Volumes 765-767)

Pages:

2448-2450

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.765-767.2448

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Online since:

September 2013

Authors:

Zhi Ling Peng

Keywords:

Accelerated Storage, Electronic Devices, Reliability

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References

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