Measurement of the Oxide Film on Cold Rolled Steel by XPS and TEM

Abstract:

X-ray photoelectron spectroscopy (XPS) and high resolution transmission electron microscopy (TEM) with high annular dark-field (HAADF) microscopy have been used to characterize the nanoscale oxide film formed naturally on the surface of cold-rolled sheet of mild steel. Main aim of this research was to confirm that XPS could be used in determining the thickness of thin oxide film as a substitute for the laborious TEM analysis. The preparation and analysis technique for the XPS depth profiling has been investigated to characterize the oxide film. The selection of appropriate sputter rate and sputter area according to sheet material components and the exact estimation of sputter depth from sputter rate during depth profiling were essential for the determination of the nanoscale oxide thickness.

• Periodical: Advanced Materials Research (Volumes 774-776)
• Pages: 1141-1144
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.774-776.1141
• Online since: September 2013
• Authors: Sang Yong Lee
• Keywords: Cold Rolled Steel, Surface Oxide Film, TEM, XPS

References

[1] P. Ghods, O.B. Isgor, J.R. Brown, F. Bensebaa, and D. Kingston: Appl. Surf. Sci. Vol. 257, (2011), p.4669.

[2] G. Bhargava, I. Gouzman, C.M. Chun, T.A. Ramanarayanan, and S.L. Bernasek: Appl. Surf. Sci. Vol. 253, (2007), p.4322.

[3] M. Shaarbaf: Materials Characterization Vol. 43, (1999), p.279.

[4] J. H. Nordlien, S. Ono, N. Masuko, and K. Nisancioglu: Corrosion Science, Vol. 39, No. 8, (1997), p.1397.

DOI: 10.1016/s0010-938x(97)00037-1