Structural Evolution and Electric Properties of Low Content Zr-Doped BiFeO3 Thin Films

Jin Li; Lei Wang; Liang Bian; Peng Jun Zhao; Jin Bao Xu

doi:10.4028/www.scientific.net/AMR.785-786.817

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 785-786Structural Evolution and Electric Properties of...

Structural Evolution and Electric Properties of Low Content Zr-Doped BiFeO₃ Thin Films

Abstract:

The pure and Zr-doped BiFeO₃ thin films were fabricated on Pt/TiO₂/SiO₂/Si substrates by sol-gel method. The microstructural characterization revealed a phase structural transition from rhombohedral structure to tetragonal structure in Zr-doped BiFeO₃ thin films. Compared with pureBiFeO₃ thin film, the Zr-doped BiFeO₃ thin films showed better dielectric and leakage current characteristics. The mechanism associated with the enhancement of the electrical properties of the thin films is also discussed.

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Periodical:

Advanced Materials Research (Volumes 785-786)

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817-820

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.785-786.817

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Online since:

September 2013

Authors:

Jin Li, Lei Wang, Liang Bian, Peng Jun Zhao, Jin Bao Xu

Keywords:

Electric Properties, Mechanism, Structure, Thin Film

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