Study on Testing of LTE Terminal Layer Two Based on TTCN-3

Fa Tang Chen; Ming Zhu; Zhi Hui Qiu

doi:10.4028/www.scientific.net/AMR.791-793.1799

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 791-793Study on Testing of LTE Terminal Layer Two Based...

Study on Testing of LTE Terminal Layer Two Based on TTCN-3

Abstract:

Consistency test is an important part in protocol development. This paper not only introduces standard of TTCN-3 and structure of LTE system layer 2, but also set an example of RLC layer to analyze the test model and designed a new test method through the development of TTCN-3 abstract test set. Based on the TTCN-3 test set of TTworkbench platform from Test Technology, the protocol consistency in RLC layer is verified and the effectiveness of the new method in consistency test is proved. Now the scheme has been applied in the project LTE system TTCN expanding test set instrument.

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Periodical:

Advanced Materials Research (Volumes 791-793)

Pages:

1799-1803

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.791-793.1799

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Online since:

September 2013

Authors:

Fa Tang Chen, Ming Zhu, Zhi Hui Qiu

Keywords:

Consistency Test, Long Term Evolution (LTE), Terminal, TTCN-3

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