Saliency Map Based Defect Alarm System for FPC Roll-to-Roll Process

An Chen; Yue Ming Hu; Xin Sheng Wu; Hong Xia Gao

doi:10.4028/www.scientific.net/AMR.816-817.866

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 816-817Saliency Map Based Defect Alarm System for FPC...

Saliency Map Based Defect Alarm System for FPC Roll-to-Roll Process

Abstract:

Defect rate in flexible printed circuit(FPC) industry is not so good. This paper propose a system and an algorithm to monitor appearance defects in FPC roll-to-roll process. This algorithm is based on selective attention mechanism computed by saliency map. Edge density is introduced as feature to compute the saliency map. Object’s distribution map is defined to help locate all the known objects in FPC. According to the particularity of roll-to-roll process, lateral difference operator is presented to highlight the defects. This operator’s algorithm involved the edge density maps and object’s distribution maps. Experimental data confirm the validity of the proposed system and algorithm.

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Periodical:

Advanced Materials Research (Volumes 816-817)

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866-869

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.816-817.866

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Online since:

September 2013

Authors:

An Chen, Yue Ming Hu, Xin Sheng Wu, Hong Xia Gao

Keywords:

Edge Density, Flexible Printed Circuit, Roll-to-Roll Process, Saliency Map, Selective Attention

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