Pseudo-Exhaustive Testing

Xin Fu; Shu Ai Fu

doi:10.4028/www.scientific.net/AMR.850-851.830

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 850-851Pseudo-Exhaustive Testing

Pseudo-Exhaustive Testing

Abstract:

There are many test generation algorithms currently. With continuously increasing of circuit scale, complexities of these algorithms are also increasingly sharply. Simple algorithms based on circuit structure, including exhaustive testing and pesudo-exhaustive testing, and simplicity of generation of test vector are more and more highlighted by scientific researchers and scholars. The dissertation mainly analyzes pseudo-exhaustive testing.

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Periodical:

Advanced Materials Research (Volumes 850-851)

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830-834

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.850-851.830

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Online since:

December 2013

Authors:

Xin Fu, Shu Ai Fu

Keywords:

Analysis, Circuit, Pseudo-Exhaustive Testing

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References

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