Formation of Super-Hydrophobic Surface by Accumulating Pollution on RTV Silicone Rubber Coating Surface

Abstract:

The Super-hydrophobic surface can be obtained easily by pollution accumulation on room temperature vulcanized (RTV) silicone rubber coating surface. The photos taken by digital camera show that the amount of pollution on the RTV coating surface was increased with time, and after one year, the RTV coating surface nearly could hardly be seen. The water state contact angle (CA) measurement, which was investigated by the static contact angle instrument, reveals that the CA value of RTV coating surface is increased with increasing the pollution accumulation, and in suitable amount of pollution accumulation, the super-hydrophobic surface (water contact angle of 152^o and roll-off angle smaller than 5 ^o) was obtained. The scanning electric microscope (SEM) of RTV coating with different pollution accumulation was investigated. It shows that the continuous micro-nanobinary structure can be formed with enough dust particles on the RTV surface. The mechanism of the effect of pollution accumulation on the wetting property was analyzed, the migration of hydrophobic molecular in RTV coating onto the pollution surface and the formation of micro-nanobinary structure on the RTV coating surface have synergistic effect on the super-hydrophobic surface formation caused by the pollution accumulation.

• Periodical: Advanced Materials Research (Volumes 875-877)
• Pages: 1520-1524
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.875-877.1520
• Online since: February 2014
• Authors: Yue Ju Zhao, Guo Gang Wang, Jin Ling Zhang, Jian Hui Wang
• Keywords: Contact Angle (CA), Hydrophobic Transfer Property, Pollution Accumulation, Room Temperature Vulcanized (RTV) Silicone Rubber, Super-Hydrophobic Surface

References

[1] L. Jiang, R. Wang, B. Yang, T. J. Li and D. A. Tryk: A. Fujishima, K. Hashimoto, D. B. Zhu, Pure Appl. Chem. Vol. 72 (2000), p.73.

[2] P. Aussillous and D. Quéré, Nature Vol. 411 (2001), p.924.

[3] F. Xia and L. Jiang, Adv. Mater., Vol. 20 (2008), p.2842.

[4] A. Lafuma and D. Quere, Nat. Mater., Vol. 2 (2003), p.457.

[5] M. Reyssat, J. M. Yeomansand and D. Quere: Europhys. Lett., Vol. 81 (2008), p.26006.

[6] B. Wilhelm, Eur. Pat., EP0772514 (1998).

[7] L. Feng, S. H. Li, H. J. Li, J. Zhai, Y. L. Song, L. Jiang and D. B. Zhu, Angew. Chem. Int. Ed. Vol. 41 (2002), p.1221.

[8] L. Zhai, F. C. Cebeci, R. E. Cohen and M. F. Rubner: Nano Lett. Vol. 4 (2004), p.1349.

[9] H. Y. Erbil, A. L. Demirel, Y. Avci and O. Mert: Science Vol. 299 (2003), p.1337.

[10] K. K. S. Lau, J. Bico, K. B. K. Teo, M. Chhowalla, G. A. J. Amaratunga, W. I. Milne, G. H. McKinley and K. K. Gleason: Nano Lett. Vol. 3 (2003), p.1701.

DOI: 10.1021/nl034704t

[11] S. Veeramasuneni, J. Drelich, J. D. Miller and G. Yamauchi: Prog. Org. Coat. Vol. 3 (1997), p.265.

[12] J. Bico, C. Marzolin and D. Quere, Europhys. Lett. Vol. 47, (1999), p.220.

[13] R.S. Gorur, E.A. Cherney, R. Hackam and T. Orbeck: IEEE Trans. Power Deliv. Vol. 3 (1992), p.1157.

[14] H. Deng and R. Hackam: IEEE Trans. Power Deliv. Vol. 12 (1997), p.857.

[15] J. R. Li and G. M. Peng: Guangxi Electric Power, Vol. 6(2009), pp.33-35.

[16] Z. D. Jia, H. F. Gao, L. M. Wang, Z. C. Guan and J. Yang: IEEE Transactions on Dielectrics and Electrical Insulation. Vol. 13 (2006), pp.1317-1324.